d37307cccf
Some checks failed
BTClock CI / build (push) Failing after 30s
BTClock CI / merge (map[name:btclock_rev_b version:esp32s3], 213epd) (push) Has been skipped
BTClock CI / merge (map[name:btclock_v8 version:esp32s3], 213epd) (push) Has been skipped
BTClock CI / merge (map[name:lolin_s3_mini version:esp32s3], 213epd) (push) Has been skipped
BTClock CI / merge (map[name:lolin_s3_mini version:esp32s3], 29epd) (push) Has been skipped
BTClock CI / release (push) Has been skipped
|
||
---|---|---|
.. | ||
test_datahandler | ||
README |
This directory is intended for PlatformIO Test Runner and project tests. Unit Testing is a software testing method by which individual units of source code, sets of one or more MCU program modules together with associated control data, usage procedures, and operating procedures, are tested to determine whether they are fit for use. Unit testing finds problems early in the development cycle. More information about PlatformIO Unit Testing: - https://docs.platformio.org/en/latest/advanced/unit-testing/index.html